Featuring the LAMBDA09 Automated Magnetostriction Tester For Thin Film Samples
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Why is measuring magnetostriction in thin films so important?
In two minutes the LAMBDA09 produces a hard copy report of the Saturation Magnetostriction Coefficient of thin film samples on small rectangular substrates, typically 1.5" by .25", (38mm long by 6mm wide), 500 microns thick. Substrate material is typically Silicon but other materials can be used as long as their Young's modulus and Poisson's ratio are known.The LAMBDA09 operation is easy to learn, with reproducible results on films as thin as 50 Angstroms with a magnetostriction coefficient as low as 10-8. See the Technical Specifications Summary for details. The information contained in the printout is also automatically archived on hard disk, for quick and easy retrieval, if later desired.
The LAMBDA09 unit has been adopted at several sites around the world as a monitoring tool to assist process control for best manufacturing yield in wafer production in both inductive and MR heads. (References available).
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